Analysis of Stability of Spring Wheat in Different Stages by Leaf Area Meter
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Assuming that the spring wheat leaf area index and coverage have temporal stability at certain locations in the leaf area meter test area, these sample locations can be used as ground sampling points for the long-term location test of the study area. The rank coefficient is used first to determine the existence of a time stable location. Spring wheat leaf area index and coverage have time stability characteristics at different growth stages.
Continuous observation data of leaf area index and coverage, the calculation of variance will inevitably have greater errors, so choose the average relative error and range as the standard to determine the time stability of leaf area index and coverage during the period of growth. The average relative error of leaf area index (or coverage) for each sample point of the leaf area instrument can be used to characterize the position of this sample point relative to the average value of the study area.
A positive number measured by the leaf area meter indicates that this sample point is higher than the average leaf area index (or coverage) of the study area, a negative number indicates a lower average leaf area index (or coverage), and a few samples of the leaf area meter The point will always equal or approximately equal the average leaf area index (or coverage) of the study area. Extreme is the average relative error of leaf area index (or coverage) of this sample during the entire growth period.